Published July 30, 2006 | Version v1
Journal article

TOF-SIMS study of photocatalytic decomposition reactions on nanocrystalline TiO2 films

  • 1. Department of Physics, University of Kaiserslautern, D-67663 Kaiserslautern (Germany) and Institute for Surface and Thin Film Analysis (IFOS), University of Kaiserslautern, D-67663 Kaiserslautern (Germany)
  • 2. Department of Physics, University of Kaiserslautern, D-67663 Kaiserslautern (Germany)
  • 3. Institute for Surface and Thin Film Analysis (IFOS), University of Kaiserslautern, D-67663 Kaiserslautern (Germany)

Description

Nanocrystalline TiO2 is known to be a very efficient photocatalyst. In order to elucidate the details of reaction pathways occurring on the surface, nanocrystalline TiO2 films (with 12 nm average crystallite size) were covered by methylene blue (MB) and studied, both in the pristine state and upon UV exposure, by TOF-SIMS. Distinct mass signals related to the MB parent molecule (m = 284.1 amu) and from fragment ions are observed for the as-prepared samples. Upon irradiation with UV light under atmospheric conditions, the surface composition is pronouncedly changed, an observation ascribed to photocatalytic reactions induced by UV photons: the amount of the parent molecule is diminished whereas intermediate reaction products are identified to be present at the TiO2 surfaces. Eventually, the parent molecule and the characteristic fragment species disappear completely upon extended exposure to UV light

Additional details

Identifiers

DOI
10.1016/j.apsusc.2006.02.216;
PII
S0169-4332(06)00470-3;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
252
Journal Issue
19
Journal Page Range
p. 6996-6999
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
15. International conference on secondary ion mass spectrometry
Acronym
SIMS XV
Dates
12-16 Oct 2005
Place
Manchester (United Kingdom)

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.