Published November 2018 | Version v1
Journal article

Atomic force microscopy for imaging and nanomechanical characterisation of live nematode epicuticle: A comparative Caenorhabditis elegans and Turbatrix aceti study

  • 1. Bionanotechnology Lab, Institute of Fundamental Medicine and Biology, Kazan Federal University, Kreml uramı 18, Kazan, Republic of Tatarstan, 420008 (Russian Federation)

Description

Highlights: • PeakForce tapping Atomic Force microscopy was applied to image live nematodes in native environments. • Nanomechanical mapping demonstrates non-uniform modulus and adhesion force distribution in adult nematodes. • High-resolution images and nanomechanical maps of Caenorhabditis elegans and Turbatrix aceti nematodes were comparatively investigated. Atomic force microscopy (AFM), a powerful tool in interdisciplinary biomedical research, has been applied here to investigate the surface of live nematodes epicuticle. We have used AFM in PeakForce Tapping non-resonant imaging and nanomechanical characterisation mode to investigate and compare the surface features of epicuticle of two free-living microscopic nematodes, Caenorhabditis elegans and Turbatrix aceti. We have successfully immobilised live anesthetized adult nematodes on glass supports using either layer-by-layer-deposited polyelectrolyte films or bioadhesive coatings, which allowed for imaging the living nematodes in native environment. We have obtained AFM images and corresponding nanomechanical maps of annular rings and furrows, demonstrating the differences in topography and structure between the species. Our results demonstrate that AFM in PeakForce Tapping mode can be used to image and characterise surfaces of relatively-large live immobilised multicellular organisms, which can be further applied to a number of invertebrates.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2018.07.008

Additional details

Identifiers

DOI
10.1016/j.ultramic.2018.07.008;
PII
S0304399117304394;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
194
Journal Page Range
p. 40-47
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
53034604
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; COATINGS; DEPOSITS; DISTRIBUTION; FILMS; GLASS; IMAGES; LAYERS; MAPPING; NEMATODES; RESOLUTION; SURFACES
Descriptors DEC
ANIMALS; INVERTEBRATES; MICROSCOPY

Optional Information

Copyright
Copyright (c) 2018 Elsevier B.V. All rights reserved.