Prism-shaped SiC nanowhiskers
- 1. Department of Materials Science and Engineering, Zhejiang University, 38 Zheda Road, Hangzhou 310027 (China)
Description
A novel nanostructured, prism-shaped β-SiC nanowhiskers have been synthesized by a reaction of carbon black and Si at 1500 deg. C for 12 h. Various durations of heating gave different growth stages that led to varied product morphologies. X-ray powder diffraction (XRD), field emission scanning electron microscope (FESEM) and high resolution transmission electron microscope (HRTEM) were used to characterize the products. These characterizations indicated that prism-shaped SiC nanowhiskers with a diameter of about 80-200 nm and the length up to several micrometers are straight, single crystalline β-SiC and the growth direction is along [1 1 1]. The results also show that the nucleation and growth process of the nanowhiskers seem to be a vapor-solid mechanism, and that the total heating time during the reaction process is a critical factor for the formation of prism-shaped SiC nanowhiskers. Some unique optical properties are found in the Raman spectroscopy that has red shift about 8 cm-1 relative to the bulk β-SiC
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2006.11.076Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2006.11.076;
- PII
- S0925-8388(06)01874-3;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 453
- Journal Issue
- 1-2
- Journal Page Range
- p. 241-246
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39060911
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CARBON BLACK; FIELD EMISSION; HEATING; MICROSTRUCTURE; MORPHOLOGY; NANOSTRUCTURES; OPTICAL PROPERTIES; RAMAN SPECTROSCOPY; RED SHIFT; RESOLUTION; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDES; TEMPERATURE RANGE 1000-4000 K; TRANSMISSION ELECTRON MICROSCOPY; WHISKERS; X-RAY DIFFRACTION
- Descriptors DEC
- CARBIDES; CARBON; CARBON COMPOUNDS; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; LASER SPECTROSCOPY; MICROSCOPY; MONOCRYSTALS; NONMETALS; PHYSICAL PROPERTIES; SCATTERING; SILICON COMPOUNDS; SPECTROSCOPY; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.