Xerographic properties of a Se:Te photoconductors
Creators
- 1. Dept. of Electrical Engineering, Univ. of Saskatchewan, Saskatoon S7N 0W0 (Canada)
Description
In this paper due to their desirable spectral response, amorphous Se:Te alloys are widely used as commercial xerographic photoreceptor materials. It is shown that the dark decay of the electrostatic surface potential on a corona-charged a-Se:Te alloy photoreceptor occurs via electric field-enhanced xerographic depletion discharge (FEXDD) in which Polle-Frenkel-assisted thermal emission of holes from deep mobility-gap states and their subsequent sweep out generates a negative bulk space charge. A theoretical expression is derived for the dependence of the xerographic depletion time td and the time required for the surface potential to decay to half its value t1/2 on the initial charging voltage V0. Experimental data show good agreement with the theory and enable the Poole-Frenkel coefficient for a-Se:Te to be evaluated. Furthermore, it is shown that at the highest charging voltages, t1/2 actually decreases with V0, which is directly attributable to the FEXDD process
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Industry Applications
- Journal Volume
- 27
- Journal Issue
- 4
- Journal Page Range
- p. 620-626.
- ISSN
- 0093-9994
- CODEN
- ITIACR
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24018649
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AMORPHOUS STATE; ELECTRON EMISSION; ELECTROSTATICS; FIELD EMISSION; FRENKEL DEFECTS; HOLES; MATERIALS TESTING; PHOTOCONDUCTORS; RESPONSE FUNCTIONS; SELENIUM TELLURIDES; SPECTRA; XEROGRAPHY
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; EMISSION; FUNCTIONS; POINT DEFECTS; SELENIUM COMPOUNDS; TELLURIDES; TELLURIUM COMPOUNDS; TESTING; VACANCIES