Down stream oxidation of silicon using an ECR microwave plasma disk reactor
Creators
- 1. Michigan State Univ., East Lansing, MI (USA)
Description
A microwave plasma disk reactor (MPDR) is being used to develop a low temperature method for growing high quality oxides on silicon wafers. In this application, the PMDR is used an an electrodeless, low maintenance, high density source of energetic oxygen ions and free radicals which are applied in the anodic growth of oxides on silicon. It is excited in a tuned, single resonant mode for efficient coupling to the plasma. The apparatus has previously been used to demonstrate the growth of high quality oxides over small areas in non-ECR microwave discharges. In this work, oxidation of a 7.6 cm diameter silicon wafer is accomplished using a 2.45 GHz multicusp electron cyclotron resonant (ECR) MPDR. The potential of scaling to a 6 to 8 inch wafer ECR processing system is discussed
Additional details
Publishing Information
- Publisher
- IEEE Service Center.
- Imprint Place
- Piscataway, NJ (USA)
- Imprint Title
- Proceedings of the 1989 IEEE international conference on plasma science (Abstracts)
- Imprint Pagination
- 180 p.
- Journal Page Range
- p. 155.
Conference
- Title
- Institute of Electrical and Electronics Engineers international conference on plasma science.
- Dates
- 22-24 May 1989.
- Place
- Buffalo, NY (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21041208
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BREAKDOWN; DIFFUSION; ECR HEATING; ELECTRICAL PROPERTIES; ELECTRON CYCLOTRON-RESONANCE; ION SOURCES; LOW TEMPERATURE; MEASURING METHODS; MICROWAVE RADIATION; OXIDATION; OXIDES; OXYGEN IONS; PLASMA; PLASMA DIAGNOSTICS; POLARIZATION; PULSED REACTORS; REVERSE-FIELD PINCH; SILICON
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; CHEMICAL REACTIONS; CYCLOTRON RESONANCE; ELECTROMAGNETIC RADIATION; ELEMENTS; HEATING; HIGH-FREQUENCY HEATING; IONS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; PINCH EFFECT; PLASMA HEATING; RADIATIONS; REACTORS; RESONANCE; SEMIMETALS
Optional Information
- Secondary number(s)
- CONF-8905184--.