Published April 2010 | Version v1
Journal article

Impact of oxygen on the diffusion of silicon in germanium: density functional theory calculations

  • 1. Department of Materials, Imperial College London, London SW7 2BP (United Kingdom)
  • 2. Institute of Material Physics, University of Münster, Wilhelm-Klemm-Strasse 10, D-48149 Münster (Germany)

Description

In the present study, density functional theory calculations have been used to predict the binding energies of clusters formed between lattice vacancies, silicon and oxygen atoms (SixOyVz) and the energy barriers associated with the migration of silicon in germanium in the presence of oxygen. It is predicted that SixOyVz clusters are stable. The results are discussed in view of recent experimental studies (Silvestri et al Semicond. Sci. Technol. 21, 758 (2006)), which suggest that the association of oxygen with silicon and vacancies leads to a retardation of silicon diffusion in germanium

Availability note (English)

Available from http://dx.doi.org/10.1088/0268-1242/25/4/045002

Additional details

Identifiers

DOI
10.1088/0268-1242/25/4/045002;
PII
S0268-1242(10)40362-4;

Publishing Information

Journal Title
Semiconductor Science and Technology
Journal Volume
25
Journal Issue
4
Journal Page Range
[4 p.]
ISSN
0268-1242
CODEN
SSTEET

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45010928
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BINDING ENERGY; DENSITY FUNCTIONAL METHOD; GERMANIUM; OXYGEN; SILICON
Descriptors DEC
CALCULATION METHODS; ELEMENTS; ENERGY; METALS; NONMETALS; SEMIMETALS; VARIATIONAL METHODS