Published April 2010
| Version v1
Journal article
Impact of oxygen on the diffusion of silicon in germanium: density functional theory calculations
Creators
- 1. Department of Materials, Imperial College London, London SW7 2BP (United Kingdom)
- 2. Institute of Material Physics, University of Münster, Wilhelm-Klemm-Strasse 10, D-48149 Münster (Germany)
Description
In the present study, density functional theory calculations have been used to predict the binding energies of clusters formed between lattice vacancies, silicon and oxygen atoms (SixOyVz) and the energy barriers associated with the migration of silicon in germanium in the presence of oxygen. It is predicted that SixOyVz clusters are stable. The results are discussed in view of recent experimental studies (Silvestri et al Semicond. Sci. Technol. 21, 758 (2006)), which suggest that the association of oxygen with silicon and vacancies leads to a retardation of silicon diffusion in germanium
Availability note (English)
Available from http://dx.doi.org/10.1088/0268-1242/25/4/045002Additional details
Identifiers
- DOI
- 10.1088/0268-1242/25/4/045002;
- PII
- S0268-1242(10)40362-4;
Publishing Information
- Journal Title
- Semiconductor Science and Technology
- Journal Volume
- 25
- Journal Issue
- 4
- Journal Page Range
- [4 p.]
- ISSN
- 0268-1242
- CODEN
- SSTEET
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45010928
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BINDING ENERGY; DENSITY FUNCTIONAL METHOD; GERMANIUM; OXYGEN; SILICON
- Descriptors DEC
- CALCULATION METHODS; ELEMENTS; ENERGY; METALS; NONMETALS; SEMIMETALS; VARIATIONAL METHODS