Published 1983
| Version v1
Report
X-ray yield from Si, Ge, and Pb sandwich samples
- 1. Frankfurt Univ. (Germany, F.R.). Inst. fuer Kernphysik
- 2. Frankfurt Univ. (Germany, F.R.). Inst. fuer Anorganische Chemie
Description
no abstract available
Additional details
Additional titles
- Original title (German)
- Roentgenausbeute von Si-, Ge- und Pb-Sandwichproben
Publishing Information
- Imprint Title
- IKF annual report 1983
- Imprint Pagination
- 158 p.
- Journal Page Range
- p. 117-118.
- Report number
- IKF--43
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 16005142
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- FLUORESCENCE; GERMANIUM; LAYERS; LEAD; PHOTON COLLISIONS; PHOTONS; PIXE ANALYSIS; SILICON; TARGET CHAMBERS; THICKNESS; X RADIATION
- Descriptors DEC
- ACCELERATOR FACILITIES; CHEMICAL ANALYSIS; COLLISIONS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; IONIZING RADIATIONS; LUMINESCENCE; MASSLESS PARTICLES; METALS; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; RADIATIONS; SEMIMETALS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- Published in summary form only. Imprint:IKF Jahresbericht 1983.