Published April 2006
| Version v1
Journal article
Simulation and comparison of the influence of metal on the tank circuits of rf SQUIDs
Creators
- 1. Superconducting Materials Center, National Institute for Materials Science, 1-2-1 Sengen Tsukuba, Ibaraki 305-0047 (Japan)
Description
In rf SQUID operation, nearby metal may influence the field distribution and the resonant frequency of the tank circuit, and then cause low frequency noise in the rf SQUID. Using an electromagnetic simulation method, we analysed the influence of metal on the resonant frequencies of three kinds of tank circuit: coplanar resonator, dielectric resonator and lumped-element tank circuit. The simulation results show that metal has the biggest influence on the coplanar resonator and the smallest influence on the dielectric resonator. This is why the high-Tc rf SQUID with a dielectric resonator has less low frequency noise than that with a coplanar resonator
Availability note (English)
Available online at http://stacks.iop.org/0953-2048/19/415/sust6_4_029.pdf or at the Web site for the journal Superconductor Science and Technology (ISSN 1361-6668) http://www.iop.org/Additional details
Identifiers
- URL
- http://stacks.iop.org/0953-2048/19/415/sust6_4_029.pdf;
- DOI
- 10.1088/0953-2048/19/4/029;
- PII
- S0953-2048(06)15563-3;
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 19
- Journal Issue
- 4
- Journal Page Range
- p. 415-417
- ISSN
- 0953-2048
- CODEN
- SUSTEF
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37085115
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DIELECTRIC MATERIALS; DISTRIBUTION; METALS; RESONATORS; SIMULATION; SQUID DEVICES; TANK CIRCUITS
- Descriptors DEC
- ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FLUXMETERS; MATERIALS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; SUPERCONDUCTING DEVICES