Published October 21, 2007
| Version v1
Journal article
Micro-strip metal detector for the beam profile monitoring
Creators
- 1. Kyiv Institute for Nuclear Research, Kyiv (Ukraine)
- 2. Institute of Micro Devices, Kyiv (Ukraine)
- 3. Deutsches Elektronen-Synchrotron, Hamburg (Germany)
- 4. Max-Planck-Institute for Nuclear Physics, Heidelberg (Germany)
Description
The Micro-strip Metal Detector (MMD) design and production technology, readout electronics as well as areas of applications are described. The MMD was designed for beam profile monitoring of charged particle and synchrotron radiation beams. Using photolithography and plasma-chemistry etching technologies we succeeded in creating detectors with a metal strip's thickness of less than 2μm and without any other materials in the working area. The principle of operation is based on the Secondary Electron Emission (SEE). The results obtained with the MMD at the monochromatic synchrotron radiation beam at HASYLAB (DESY) are also presented. The current version of the MMD allows measuring a beam profile and position with an accuracy of 20μm
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2007.08.042Additional details
Identifiers
- DOI
- 10.1016/j.nima.2007.08.042;
- PII
- S0168-9002(07)01714-7;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 581
- Journal Issue
- 1-2
- Journal Page Range
- p. 531-534
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 11. international Vienna conference on instrumentation
- Acronym
- VCI 2007
- Dates
- 19-21 Feb 2007
- Place
- Vienna (Austria)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39064105
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; BEAM PROFILES; BEAMS; CHEMISTRY; CURRENTS; DESIGN; DESY; ELECTRON EMISSION; ELECTRONS; ETCHING; IONS; METALS; MONITORING; MONOCHROMATIC RADIATION; READOUT SYSTEMS; SYNCHROTRON RADIATION; THICKNESS
- Descriptors DEC
- ACCELERATORS; BREMSSTRAHLUNG; CHARGED PARTICLES; CYCLIC ACCELERATORS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; FERMIONS; LEPTONS; RADIATIONS; SURFACE FINISHING; SYNCHROTRONS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.