Temporal distortions in magnetic lenses
Creators
- 1. Max-Planck-Institute of Quantum Optics, and Ludwig-Maximilians-Universität München, Am Coulombwall 1, 85748 Garching (Germany)
Description
We consider the temporal aberrations of femtosecond electron pulses in magnetic lens systems. We identify two mechanisms for distortions: Within the lens, rotational motion around the propagation axis results in outer parts of the pulse being delayed. After the lens, conversion from radial to longitudinal velocity causes a dynamical reshaping of the electron pulse during propagation towards the image plane. In combination, the pulses refocus back closely to the original pulse duration, but at a position far away from the image plane. Only for a magnification of two there is an approximate coincidence. Calculations of simplified trajectories provide a conceptual picture of signs and magnitudes; details are studied by numerical simulations of realistic lenses. For typical geometries in ultrafast diffraction and microscopy, distortions can amount to tens of femtoseconds and thus limit the temporal resolution even when using single-electron sources without space charge. Compensation of temporal aberrations can be achieved by combining lenses in sequence, resulting in what we call an 'isochronic' lens system for charged particles. We discuss the implications for ultrafast atomic-scale imaging by 4D electron microscopy and diffraction. -- Highlights: ► Magnetic lenses distort the temporal shape of femtosecond electron pulses. ► Two distinct contributions are identified: rotation within the lens and continuous reshaping caused by magnification. ► Numerical simulations and simplified trajectory calculations provide a general, and physical picture. ► Combinations of a microwave cavity with non-distorting lenses are suited to achieve few-femtosecond and μm-sized spatiotemporal focuses at the same time.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2011.11.018Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2011.11.018;
- PII
- S0304-3991(11)00337-8;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 113
- Journal Issue
- Complete
- Journal Page Range
- p. 145-151
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45025492
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- APPROXIMATIONS; COMPUTERIZED SIMULATION; ELECTROMAGNETIC LENSES; ELECTRON MICROSCOPY; ELECTRON SOURCES; GEOMETRICAL ABERRATIONS; IMAGES; MICROWAVE RADIATION; PULSES; ROTATION; SOLENOIDS; SPACE CHARGE; TIME RESOLUTION
- Descriptors DEC
- CALCULATION METHODS; ELECTRIC COILS; ELECTRICAL EQUIPMENT; ELECTROMAGNETIC RADIATION; EQUIPMENT; LENSES; MICROSCOPY; MOTION; PARTICLE SOURCES; RADIATION SOURCES; RADIATIONS; RESOLUTION; SIMULATION; TIMING PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.