Published June 21, 2000 | Version v1
Journal article

Using of slow positrons in various investigations - state of the art and perspectives

Description

Slow positrons have become a unique probe in research of electronic structure of matter, in data acquisition on Fermi surface in metals and alloys, in studying of formation processes of structural and radiation defects in metals, semiconductors, polymers and nanocrystalline structures. First positron microscopes, PAES-spectrometers, positron ionization mass spectrometers and positron tomographs have been already created. In this paper results obtained by positron annihilation method in different research fields and possibilities of future progress in obtaining of high-intensity, high-brightness slow positron beams of variable energy are briefly discussed

Additional details

Identifiers

PII
S0168900200002060;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
448
Journal Issue
1-2
Journal Page Range
p. 89-93
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
34045132
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ANNIHILATION; ELECTRONIC STRUCTURE; FERMI LEVEL; FORECASTING; MASS SPECTROMETERS; MATERIALS TESTING; POSITRON BEAMS; USES
Descriptors DEC
BEAMS; ENERGY LEVELS; INTERACTIONS; LEPTON BEAMS; MEASURING INSTRUMENTS; PARTICLE BEAMS; PARTICLE INTERACTIONS; SPECTROMETERS; TESTING

Optional Information

Copyright
Copyright (c) 2000 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.