Published June 21, 2000
| Version v1
Journal article
Using of slow positrons in various investigations - state of the art and perspectives
Creators
Description
Slow positrons have become a unique probe in research of electronic structure of matter, in data acquisition on Fermi surface in metals and alloys, in studying of formation processes of structural and radiation defects in metals, semiconductors, polymers and nanocrystalline structures. First positron microscopes, PAES-spectrometers, positron ionization mass spectrometers and positron tomographs have been already created. In this paper results obtained by positron annihilation method in different research fields and possibilities of future progress in obtaining of high-intensity, high-brightness slow positron beams of variable energy are briefly discussed
Additional details
Identifiers
- PII
- S0168900200002060;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 448
- Journal Issue
- 1-2
- Journal Page Range
- p. 89-93
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34045132
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANNIHILATION; ELECTRONIC STRUCTURE; FERMI LEVEL; FORECASTING; MASS SPECTROMETERS; MATERIALS TESTING; POSITRON BEAMS; USES
- Descriptors DEC
- BEAMS; ENERGY LEVELS; INTERACTIONS; LEPTON BEAMS; MEASURING INSTRUMENTS; PARTICLE BEAMS; PARTICLE INTERACTIONS; SPECTROMETERS; TESTING
Optional Information
- Copyright
- Copyright (c) 2000 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.