Published July 2010
| Version v1
Journal article
Microstructural investigation of Ti-Si-N hard coatings
Creators
- 1. The Australian Key Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW 2006 (Australia)
- 2. Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom)
- 3. CSIRO Materials Science and Engineering, P.O. Box 218, Lindfield, NSW 2070 (Australia)
Description
The microstructures of nanostructured Ti-Si-N hard coatings were investigated by transmission electron microscopy and pulsed laser atom probe. C and O impurities were detected. No evidence of increased Si levels at the grain boundaries was found, suggesting that Si is either in the form of a layer too thin to be detected using the techniques employed or in the form of a solid solution of SiN clusters.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2010.03.050Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2010.03.050;
- PII
- S1359-6462(10)00196-X;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 63
- Journal Issue
- 2
- Journal Page Range
- p. 192-195
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45024314
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COATINGS; GRAIN BOUNDARIES; IMPURITIES; LAYERS; NANOSTRUCTURES; NITROGEN; OXYGEN; PULSES; SILICON NITRIDES; SOLID CLUSTERS; SOLID SOLUTIONS; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- DISPERSIONS; ELECTRON MICROSCOPY; ELEMENTS; HOMOGENEOUS MIXTURES; MICROSCOPY; MICROSTRUCTURE; MIXTURES; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; PNICTIDES; SILICON COMPOUNDS; SOLUTIONS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.