Published 1990
| Version v1
Book
X-ray measurement of material properties in composites
Creators
- 1. Johns Hopkins University, Baltimore, MD (United States)
- 2. Iowa State University of Science and Technology, Ames (United States)
- 3. DOE, Ames Laboratory IA (United States)
Description
This paper describes the utility of an X-ray based technique for the quantitative determination of the levels of porosity in several classes of materials; reinforcement content, metal matrix fiber, and the detection of process control problems in metal matrix composites, and the determination of the morphology of the flaw. The experimental configuration consists of a stationary X-ray source and a scintillation detector shielded to protect the detector from the scattered radiation, collimated to define a pencil beam of radiation. Results are comparable or better than the measurements by other techniques, at least in the examples where data for both techniques are available. 8 refs
Additional details
Publishing Information
- Publisher
- Plenum Press.
- Imprint Place
- New York, NY (United States)
- Imprint Title
- Review of progress in quantitative nondestructive evaluation. Vols. 9A ampersand 9B
- Imprint Pagination
- vp.
- Journal Page Range
- p. 1465-1471.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23034657
- Subject category
- S36: MATERIALS SCIENCE; S42: ENGINEERING; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AEROSPACE INDUSTRY; COLLIMATORS; COMPARATIVE EVALUATIONS; COMPOSITE MATERIALS; DEFECTS; DETECTION; FIBERS; MATRIX MATERIALS; MEASURING METHODS; MECHANICAL PROPERTIES; MORPHOLOGY; NONDESTRUCTIVE TESTING; PERFORMANCE; POROSITY; PROCESS CONTROL; REINFORCED MATERIALS; SCINTILLATION COUNTERS; SILICON CARBIDES; X-RAY EQUIPMENT; X-RAY SOURCES
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; CONTROL; EQUIPMENT; EVALUATION; INDUSTRY; MATERIALS; MATERIALS TESTING; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATION SOURCES; SILICON COMPOUNDS; TESTING
Optional Information
- Notes
- Imprint:927.