Published June 2003 | Version v1
Journal article

MeV energy Lithium ion irradiated crystalline GaAs: an optical study

Description

An optical study of GaAs <1 0 0>, undoped, irradiated with 50 MeV Li-ion at room temperature with a fluence ranging from 1x1011 to 1x1014 ions/cm2 using Pelletron ion beam facility of Nuclear Science Centre (NSC), New Delhi has been carried out in the spectral regions of the fundamental optical absorption and interband transition. The damage induced by the MeV ion in the surface and deep inside the semiconductor has been monitored by determining the ion fluence dependence of the optical constants: absorption coefficient (α), reflection (R), ion-irradiation induced defect density (Ns) and optical energy gap (Eg) in the spectral range 200-2500 nm. The present study reveals that the ion irradiation does not induce significant changes in the surface of a semiconductor. The fundamental optical absorption spectra are, however, greatly modified by MeV energy ion-solid interaction

Additional details

Identifiers

DOI
10.1016/S1350-4487(03)00218-X;
arXiv
arXiv:hep-ph/9809410v3;
PII
S135044870300218X;

Publishing Information

Journal Title
Radiation Measurements
Journal Volume
36
Journal Issue
1-6
Journal Page Range
p. 647-652
ISSN
1350-4487
CODEN
RMEAEP

Conference

Title
21. international conference on nuclear tracks in solids
Dates
21-25 Oct 2003
Place
New Delhi (India)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35033365
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTRA; ENERGY GAP; GALLIUM ARSENIDES; ION BEAMS; IRRADIATION; LITHIUM IONS; OPTICAL REFLECTION; PHYSICAL RADIATION EFFECTS
Descriptors DEC
ARSENIC COMPOUNDS; ARSENIDES; BEAMS; CHARGED PARTICLES; GALLIUM COMPOUNDS; IONS; PNICTIDES; RADIATION EFFECTS; REFLECTION; SPECTRA

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.