Published August 2009 | Version v1
Journal article

Development of a roughness measurement standard with irregular surface topography for improving 3D surface texture measurement

  • 1. Department of Mechanical Engineering, Nagaoka University of Technology, Kamitomioka 1603-1, Nagaoka (Japan)
  • 2. Innovation Satellite Niigata, Japan Science and Technology Agency (Japan)
  • 3. Department of Mechanical Engineering, Iwate University (Japan)
  • 4. Laser Application Research Laboratory, Industrial Research Institute of Niigata Prefecture (Japan)

Description

In this study, measurement standards with irregular surface topography which can be used for surface texture measuring instruments of various measurement principles are proposed, and the verification system for surface texture measuring instruments is established using the measurement standard. We have generated the software gauge data with 3D irregular surface texture using the non-causal 2D auto-regressive model (2D AR model). This model can generate periodic irregular surface topography data from specified surface texture parameters, and based on the generated software gauge data, the measurement standards were manufactured by machining with a diamond ball end mill. The short wavelength components which cannot be processed by the ball end mill were removed from the original machining data by the morphological filter. Manufactured measurement standards were measured using three types of surface texture measuring instruments. Proposed measurement standards can be used for various types of measuring instruments

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/20/8/084023

Additional details

Identifiers

DOI
10.1088/0957-0233/20/8/084023;
PII
S0957-0233(09)01024-8;

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
20
Journal Issue
8
Journal Page Range
[7 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45005592
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
DIAMONDS; MEASURING INSTRUMENTS; PERIODICITY; ROUGHNESS; STANDARDS; SURFACES; TEXTURE; TOPOGRAPHY
Descriptors DEC
CARBON; ELEMENTS; MINERALS; NONMETALS; SURFACE PROPERTIES; VARIATIONS