Development of a roughness measurement standard with irregular surface topography for improving 3D surface texture measurement
Creators
- 1. Department of Mechanical Engineering, Nagaoka University of Technology, Kamitomioka 1603-1, Nagaoka (Japan)
- 2. Innovation Satellite Niigata, Japan Science and Technology Agency (Japan)
- 3. Department of Mechanical Engineering, Iwate University (Japan)
- 4. Laser Application Research Laboratory, Industrial Research Institute of Niigata Prefecture (Japan)
Description
In this study, measurement standards with irregular surface topography which can be used for surface texture measuring instruments of various measurement principles are proposed, and the verification system for surface texture measuring instruments is established using the measurement standard. We have generated the software gauge data with 3D irregular surface texture using the non-causal 2D auto-regressive model (2D AR model). This model can generate periodic irregular surface topography data from specified surface texture parameters, and based on the generated software gauge data, the measurement standards were manufactured by machining with a diamond ball end mill. The short wavelength components which cannot be processed by the ball end mill were removed from the original machining data by the morphological filter. Manufactured measurement standards were measured using three types of surface texture measuring instruments. Proposed measurement standards can be used for various types of measuring instruments
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/20/8/084023Additional details
Identifiers
- DOI
- 10.1088/0957-0233/20/8/084023;
- PII
- S0957-0233(09)01024-8;
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 20
- Journal Issue
- 8
- Journal Page Range
- [7 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45005592
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DIAMONDS; MEASURING INSTRUMENTS; PERIODICITY; ROUGHNESS; STANDARDS; SURFACES; TEXTURE; TOPOGRAPHY
- Descriptors DEC
- CARBON; ELEMENTS; MINERALS; NONMETALS; SURFACE PROPERTIES; VARIATIONS