CdZnTe drift detector with correction for hole trapping
- 1. Danish Space Research Inst., Copenhagen (Denmark)
Description
The results are presented of a CdZnTe drift detector for which the energy determination can be corrected for hole trapping. The electronic noise and the hole contribution to the signal are reduced and the signals are also corrected for any residual effects of hole trapping. This is achieved by using drift strips and an anode strip on one side of the detector crystal in combination with a single planar electrode on the other side. Below 100 keV, the resolution (in FWHM) was electronic noise limited. Using a planar electrode, the peak of 241Am at 59.6 keV has a width of 14.1 keV. The resolution improved to 3.21 keV when using the anode strip. This is comparable to the electronic noise of 3.11 keV. At 661 keV, no peak could be observed in the spectrum of 137Cs with the planar electrode. However, with the anode strip, a peak with a width of 17.9 keV was observed. The resolution improved further to 6.9 keV after correction for hole trapping. After correction, the peak-to-valley ratio was 40:1, with a peak-to-Compton ratio of 4:1. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 411
- Journal Issue
- 1
- Journal Page Range
- p. 197-200
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 29051991
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ANODES; BACKGROUND NOISE; CADMIUM TELLURIDES; CDTE SEMICONDUCTOR DETECTORS; CORRECTIONS; ENERGY RESOLUTION; GAMMA DETECTION; GAMMA SPECTROSCOPY; HOLES; KEV RANGE 10-100; KEV RANGE 100-1000; SEMICONDUCTOR MATERIALS; TRAPPING; ZINC TELLURIDES
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; DETECTION; ELECTRODES; ENERGY RANGE; KEV RANGE; MATERIALS; MEASURING INSTRUMENTS; NOISE; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SPECTROSCOPY; TELLURIDES; TELLURIUM COMPOUNDS; ZINC COMPOUNDS
Optional Information
- Notes
- 2 refs.