Published December 14, 2013 | Version v1
Journal article

Multiexciton complex from extrinsic centers in AlGaAs epilayers on Ge and Si substrates

  • 1. Dipartimento di Fisica e Astronomia, LENS and CNISM, Università di Firenze, Via Sansone 1, I-50019 Firenze (Italy)
  • 2. Dipartimento di Scienza dei Materiali and L-NESS, Università di Milano Bicocca, Via Cozzi 53, I-20125 Milano (Italy)
  • 3. Dipartimento di Fisica and L-NESS, Politecnico di Milano, Via Anzani 42, 22100 Como (Italy)

Description

The multiexciton properties of extrinsic centers from AlGaAs layers on Ge and Si substrates are addressed. The two photon cascade is found both in steady state and in time resolved experiments. Polarization analysis of the photoluminescence provides clearcut attribution to neutral biexciton complexes. Our findings demonstrate the prospect of exploiting extrinsic centers for generating entangled photon pairs on a Si based device

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
114
Journal Issue
22
Journal Page Range
p. 224314-224314.3
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
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