Published November 2001
| Version v1
Journal article
Hyperfine Interaction of Metamict Zircon Studied by PAC Spectroscopy
Creators
- 1. Miami University, Department of Physics (United States)
Description
Zircon (ZrSiO4) is a common accessory mineral found in igneous and metamorphic rocks and is generally in an amorphous state due to self-irradiation from radioactive impurities. The crystalline structure may be recovered by annealing. We have studied the annealing behavior of a nearly fully metamict zircon specimen by perturbed angular correlation spectroscopy and powder X-ray diffraction. Our results are consistent with accepted damage accumulation models and point to a two-stage recovery process for the transition from metamict to crystalline zircon. In all of our experiments PAC overestimates the amorphous fraction as compared to that determined by diffraction experiments, and we propose an explanation for this discrepancy
Additional details
Identifiers
Publishing Information
- Journal Title
- Hyperfine Interactions
- Journal Volume
- 136-137
- Journal Issue
- 3-8
- Journal Page Range
- p. 515-521
- ISSN
- 0304-3843
- CODEN
- HYINDN
Conference
- Title
- 12. international conference on hyperfine interactions
- Dates
- 12-17 Aug 2001
- Place
- Park City, UT (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40091731
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMORPHOUS STATE; ANNEALING; BUILDUP; DAMAGE; IMPURITIES; INTERACTIONS; METAMORPHIC ROCKS; PERTURBED ANGULAR CORRELATION; POWDERS; SELF-IRRADIATION; SPECTROSCOPY; X-RAY DIFFRACTION; ZIRCON; ZIRCONIUM SILICATES
- Descriptors DEC
- ANGULAR CORRELATION; COHERENT SCATTERING; CORRELATIONS; DIFFRACTION; HEAT TREATMENTS; IRRADIATION; MINERALS; OXYGEN COMPOUNDS; ROCKS; SCATTERING; SILICATE MINERALS; SILICATES; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; ZIRCONIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2001 Kluwer Academic Publishers