Titanium oxide nanocoating on a titanium thin film deposited on a glass substrate
Creators
- 1. Nanosciences African Network (NANOAFNET), iThemba LABS, National Research Foundation, 1 Old Faure Road, Somerset West 7129, PO Box 722, Somerset West, Western Cape (South Africa)
- 2. UNESCO-UNISA Africa Chair in Nanosciences-Nanotechnology, College of Graduate Studies, University of South Africa, Muckleneuk Ridge, PO Box 392, Pretoria (South Africa)
- 3. Physics Department, Politecnico di Milano, Piazza Leonardo Da Vinci, 32, 20133 Milano (Italy)
- 4. University of the Western Cape, Electron Microscopy Unit, Physics Department, Bellville 7535, Cape Town (South Africa)
- 5. Center for Nano Science and Technology, Istituto Italiano di Tecnologia, Milano, Italy Via Giovanni Pascoli, 70/3, 20133 Milano (Italy)
- 6. Institute for Photonics and Nanotechnologies (IFN)-CNR, Piazza Leonardo Da Vinci, 32, 20133 Milano (Italy)
Description
Thin films of titanium were deposited on a glass substrate using electron beam evaporator. Femtosecond laser pulses were focused on the surface of the films, and the samples were scanned while mounted on the motorized computer-controlled motion stage to produce an areal modification of the films. X-ray diffraction of the laser-patterned samples showed evidence of the formation of a γ-Ti3O5 with a monoclinic phase. Rutherford backscattering spectrometry simulation showed that there is an increase in the oxygen concentration as the average laser fluence is increased. Time of flight secondary ions mass spectrometry analysis showed an even distribution of the titanium and oxygen ions on the sample and also ionized molecules of the oxides of titanium were observed. The formation of the oxide of titanium was further supported using the UV–Vis-NIR spectroscopy, which showed that for 0.1 J/cm2 fluence, the laser-exposed film showed the electron transfer band and the d–d transition peak of titanium was observed at lower wavelengths. - Highlights: • γ-Ti3O5 formed using femtosecond laser. • Fluence and oxygen relation were studied. • Nanoflakes of γ-Ti3O5 were observed under HRSEM.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2016.02.055Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2016.02.055;
- PII
- S0040-6090(16)00154-1;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 603
- Journal Page Range
- p. 446-451
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48020886
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ELECTRON BEAMS; ELECTRON TRANSFER; GLASS; ION MICROPROBE ANALYSIS; LASER RADIATION; MASS SPECTROSCOPY; MICROSTRUCTURE; MONOCLINIC LATTICES; PULSED IRRADIATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SUBSTRATES; SURFACES; THIN FILMS; TIME-OF-FLIGHT METHOD; TITANIUM; TITANIUM OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; CHALCOGENIDES; CHEMICAL ANALYSIS; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; IRRADIATION; LEPTON BEAMS; METALS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; RADIATIONS; SCATTERING; SPECTROSCOPY; THREE-DIMENSIONAL LATTICES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.