Published July 1, 2016 | Version v1
Journal article

First principles study of the C/Si ratio effect on the ideal shear strength of β–SiC

  • 1. State Nuclear Power Research Institute, Beijing, 102209 (China)
  • 2. School of Power and Mechanical Engineering, Wuhan University, Wuhan 430072 (China)
  • 3. Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing (China)

Description

The effect of the C/Si atomic ratio on the ideal shear strength of β-SiC is investigated with first principles calculations. β SiC samples with different C/Si ratios are generated by Monte Carlo (MC) simulations with empirical inter-atomic SiC potential. Each SiC sample is sheared along the 100 direction and the stress-strain curve is calculated from first principles. The results show that the ideal shear strength of SiC decreases with the increase of C/Si ratio. For a non-stoichiometric SiC sample, a C–C bond inside a large carbon cluster breaks first under shear strain condition due to the internal strain around the carbon clusters. Because the band gap is narrowed under shear strain conditions, a local maximum stress appears in the elastic region of the stress-strain curve for each SiC sample at certain strain condition. The yield strength may increase with the increase of C/Si ratio. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/2053-1591/3/7/075503

Additional details

Identifiers

Publishing Information

Journal Title
Materials Research Express (Online)
Journal Volume
3
Journal Issue
7
Journal Page Range
[8 p.]
ISSN
2053-1591

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
51036609
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CARBON; MONTE CARLO METHOD; SHEAR; SHEAR PROPERTIES; SILICON CARBIDES; SIMULATION; STOICHIOMETRY; STRAINS; STRESSES; YIELD STRENGTH
Descriptors DEC
CALCULATION METHODS; CARBIDES; CARBON COMPOUNDS; ELEMENTS; MECHANICAL PROPERTIES; NONMETALS; SILICON COMPOUNDS