Photoconductivity in reactively evaporated copper indium selenide thin films
- 1. Solid State Physics Laboratory, Cochin University of Science and Technology, Kochi, Kerala (India)
- 2. Thin Film Research Laboratory, Union Christian College, Aluva, Kerala (India)
Description
Copper indium selenide thin films of composition CuInSe2 with thickness of the order of 130 nm are deposited on glass substrate at a temperature of 423 ±5 K and pressure of 10−5 mbar using reactive evaporation, a variant of Gunther's three temperature method with high purity Copper (99.999%), Indium (99.999%) and Selenium (99.99%) as the elemental starting materials. X-ray diffraction (XRD) studies shows that the films are polycrystalline in nature having preferred orientation of grains along the (112) plane. The structural type of the film is found to be tetragonal with particle size of the order of 32 nm. The structural parameters such as lattice constant, particle size, dislocation density, number of crystallites per unit area and strain in the film are also evaluated. The surface morphology of CuInSe2 films are studied using 2D and 3D atomic force microscopy to estimate the grain size and surface roughness respectively. Analysis of the absorption spectrum of the film recorded using UV-Vis-NIR Spectrophotometer in the wavelength range from 2500 nm to cutoff revealed that the film possess a direct allowed transition with a band gap of 1.05 eV and a high value of absorption coefficient (α) of 106 cm−1 at 570 nm. Photoconductivity at room temperature is measured after illuminating the film with an FSH lamp (82 V, 300 W). Optical absorption studies in conjunction with the good photoconductivity of the prepared p-type CuInSe2 thin films indicate its suitability in photovoltaic applications
Additional details
Identifiers
- DOI
- 10.1063/1.4861984;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1576
- Journal Issue
- 1
- Journal Page Range
- p. 69-72
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 2. international conference on optoelectronic materials and thin films for advanced technology
- Acronym
- OMTAT 2013
- Dates
- 3-5 Jan 2013
- Place
- Kochi, Kerala (India)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45085258
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; ABSORPTION SPECTRA; ATOMIC FORCE MICROSCOPY; COPPER; DENSITY; DISLOCATIONS; GRAIN ORIENTATION; GRAIN SIZE; INDIUM; LATTICE PARAMETERS; PARTICLE SIZE; PHOTOCONDUCTIVITY; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; LINE DEFECTS; METALS; MICROSCOPY; MICROSTRUCTURE; ORIENTATION; PHYSICAL PROPERTIES; SCATTERING; SIZE; SORPTION; SPECTRA; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC