Published April 1, 2006
| Version v1
Journal article
Recent advances in automated system model extraction (SME)
Creators
- 1. IntelliSense Corporation (United States)
- 2. Electrical Engineering Department, Indian Institute of Technology, Bombay (India)
Description
In this paper we present two different techniques for automated extraction of system models from FEA models. We discuss two different algorithms: for (i) automated N-DOF SME for electrostatically actuated MEMS and (ii) automated N-DOF SME for MEMS inertial sensors. We will present case studies for the two different algorithms presented
Availability note (English)
Available online at http://stacks.iop.org/1742-6596/34/698/jpconf6_34_115.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 34
- Journal Issue
- 1
- Journal Page Range
- p. 698-703
- ISSN
- 1742-6596
Conference
- Title
- International MEMS conference 2006
- Acronym
- iMEMS2006
- Dates
- 9-12 May 2006
- Place
- Singapore (Singapore)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37058586
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALGORITHMS; AUTOMATION; ELECTROMECHANICS; ELECTROSTATICS; MICROSTRUCTURE
- Descriptors DEC
- MATHEMATICAL LOGIC; MECHANICS