Published November 2017
| Version v1
Journal article
Damage investigation and modeling of 3D woven ceramic matrix composites from X-ray tomography in-situ tensile tests
Creators
- 1. SAFRAN CERAMICS, F-33185, Le Haillan (France)
- 2. LCTS (Univ. de Bordeaux/CNRS/CEA/SAFRAN CERAMICS), 3 allée de la Boétie, F-33600, Pessac (France)
- 3. LMT (ENS Paris-Saclay/CNRS/Univ. Paris-Saclay), 61 av. President Wilson, F-94235, Cachan (France)
- 4. I2M (Arts et Métiers ParisTech/CNRS/Univ. de Bordeaux), Esplanade des Arts et Métiers, F-33405, Talence (France)
Description
The present paper proposes an investigation of the failure events in a melt-infiltrated SiC/SiC composite. In-situ X-ray microtomography tensile tests were performed at room temperature and at 1250 °C in air. Digital Volume Correlation has been used to identify the damage mechanisms within the material at increasing loads and to propose a damage scenario. Realistic finite element meshes have been constructed from the 3D images to numerically reproduce the experiments at the meso-scale. Elastic simulations exhibit stress concentrations in the planes containing the weft tows. The first cracks and subsequent damage localization were found to appear within these planes thanks to the analysis of the in-situ tomographic data.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2017.08.034Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2017.08.034;
- PII
- S1359-6454(17)30687-0;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 140
- Journal Issue
- Complete
- Journal Page Range
- p. 130-139
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49045683
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DAMAGE; FINITE ELEMENT METHOD; MATRICES; SILICON CARBIDES; SIMULATION; TEMPERATURE RANGE 0273-0400 K; TOMOGRAPHY; X RADIATION
- Descriptors DEC
- CALCULATION METHODS; CARBIDES; CARBON COMPOUNDS; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MATHEMATICAL SOLUTIONS; NUMERICAL SOLUTION; RADIATIONS; SILICON COMPOUNDS; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.