An in situ field-ion microscope research of radiation damage in tungsten
Description
Results of experiments in which tungsten was irradiated in situ in the field-ion microscope with inert gas ions are described. Tungsten field-ion specimens were irradiated at 78 K with ions in the 0.5 to 9 keV energy range. Sputtering and displacement of surface atoms which had occurred during irradiation were observed directly in field-ion images. Large scale damage such as vacancy clusters were rarely found. From the ion acceleration voltage and the accommodation coefficient, the displacement energy of tungsten surface atoms in the electric field of about 44 MV/mm is estimated as nearly 22 eV. Damage was observed on the shielded side of the tip apex as well as on the ion incident side, and this fact is discussed in comparison with the channelling of ions in tungsten. (author)
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Microscopy
- Journal Volume
- 106
- Journal Issue
- 3
- Series
- J. Microsc. (Oxford).
- Journal Page Range
- 311-323
- ISSN
- 0022-2720
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 7270514
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- EV RANGE 100-1000; ION BEAMS; ION MICROSCOPES; ION MICROSCOPY; IONS; KEV RANGE 01-10; LOW TEMPERATURE; PHYSICAL RADIATION EFFECTS; RARE GASES; TUNGSTEN
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELEMENTS; ENERGY RANGE; EV RANGE; KEV RANGE; METALS; MICROSCOPES; MICROSCOPY; NONMETALS; RADIATION EFFECTS; TRANSITION ELEMENTS
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent