Published June 2017 | Version v1
Journal article

Ptychographic imaging for the characterization of X-ray free-electron laser beams

  • 1. Department of Physics and Astronomy, University College London, London WC1E 6BT (United Kingdom)
  • 2. Department of Cell and Molecular Biology, Uppsala University, 75124 Uppsala (Sweden)
  • 3. Department of Physics, National University of Singapore, Singapore 117551 (Singapore)
  • 4. Department of Physics and Astronomy, University of Southampton, Southampton SO17 1BJ (United Kingdom)

Description

We present some preliminary results from a study aimed at the characterization of the wavefront of X-ray free electron laser (XFEL) beams in the same operation conditions as for single particle imaging (or flash X-ray imaging) experiments. The varying illumination produced by wavefront fluctuations between several pulses leads to a partially coherent average beam which can be decomposed into several coherent modes using ptychographic reconstruction algorithms. Such a decomposition can give insight into pulse-to-pulse variations of the wavefront. We discuss data collected at the Linac Coherent Light Source (LCLS) and FERMI. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/849/1/012032

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
849
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
X-ray microscopy conference 2016
Acronym
XRM 2016
Dates
15-19 Aug 2016
Place
Oxford (United Kingdom)