Published January 2005 | Version v1
Journal article

Modified method for registration of particle deflection by a bent crystal

Description

A modified method for registration of particle deflection by a bent crystal was proposed and studied at the external proton beam of the Nuclotron. A telescope of scintillation counters was placed at an angle that was smaller than the crystal bending angle. The count dependence of the telescope on the crystal orientation was formed by the particles, which passed in channeling states only some part of the crystal length. Two maximums were observed in the dependencies due to particles captured into the channeling states at the crystal surface and in the crystal volume. This allows to receive, using the telescope and high-intensity beams, a useful data about the particle channeling and the crystal what usually demands more complicated registration by means of coordinate detectors. The proposed method can be useful for the investigation of particle deflection by the crystals, in which the particle channeling length is small because of some lattice defects

Additional details

Identifiers

DOI
10.1016/j.nimb.2004.03.071;
PII
S0168583X04004756;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
227
Journal Issue
1-2
Journal Page Range
p. 16-21
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
6. international symposium on radiation from relativistic electrons in periodic structures
Acronym
RREPS'03
Dates
8-11 Sep 2003
Place
Tomsk (Russian Federation)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36020678
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BENDING; CRYSTAL DEFECTS; CRYSTALS; ORIENTATION; PROTON BEAMS; PROTON CHANNELING; SCINTILLATION COUNTERS; SURFACES; TELESCOPE COUNTERS
Descriptors DEC
BEAMS; CHANNELING; CRYSTAL STRUCTURE; DEFORMATION; MEASURING INSTRUMENTS; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION DETECTORS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.