A Room-Temperature Pre-calibration Procedure for Gradiometer Sifting
- 1. State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050 (China)
- 2. Department of Electronic Science and Technology, University of Science and Technology of China, Hefei 230026 (China)
Description
In order to detect extremely weak magnetic signals, superconducting quantum interference device (SQUID) gradiometers are widely used to suppress environmental noise. A hardware SQUID gradiometer consists of a niobium gradio-antenna and an SQUID, which are coupled via an input coil. Here gradiometer imbalance may greatly reduce its noise suppression performance. The gradiometer balance depends on the geometrical forms of the antenna wound by niobium wire. We describe a simple method based on Faraday's law for the pre-calibration of the gradiometer balance at room temperature, before the gradiometer is set up. The pre-calibrating results are compared with the measured balance of an SQUID gradiometer system. This method may be used for sifting hardware gradiometers for multi-channel systems. (cross-disciplinary physics and related areas of science and technology)
Availability note (English)
Available from http://dx.doi.org/10.1088/0256-307X/28/3/038501Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics Letters
- Journal Volume
- 28
- Journal Issue
- 3
- Journal Page Range
- [3 p.]
- ISSN
- 0256-307X
- CODEN
- CPLEEU
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45002969
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ANTENNAS; CALIBRATION; COMPARATIVE EVALUATIONS; MAGNETOMETERS; NIOBIUM; NOISE; PERFORMANCE; SIGNALS; SQUID DEVICES; TEMPERATURE RANGE 0273-0400 K; WIRES
- Descriptors DEC
- ELECTRICAL EQUIPMENT; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; EVALUATION; FLUXMETERS; MEASURING INSTRUMENTS; METALS; MICROWAVE EQUIPMENT; REFRACTORY METALS; SUPERCONDUCTING DEVICES; TEMPERATURE RANGE; TRANSITION ELEMENTS