Improvement of the Applicability, Efficiency, andPrecision of the Penning Trap Mass Spectrometer ISOLTRAP
Creators
- 1. CERN (Switzerland)
- 2. Michigan State University, NSCL (United States)
- 3. GSI (Germany)
- 4. CSNSM-IN2P3-CNRS (France)
- 5. McGill University, Department of Physics (Canada)
- 6. University of Jyvaeskylae, Department of Physics (Finland)
Description
With the Penning trap mass spectrometer ISOLTRAP, close to 200 nuclides have already been investigated and their masses determined with a typical relative precision of δm/m=10-7. Recently, ISOLTRAP's beam preparation system was replaced by an RFQ ion beam cooler and buncher. The principle and the characteristics of this new beam preparation system will be presented. It is planned to use ions of various carbon clusters C+n (n>1) as reference ions for mass measurements. Apart from negligible molecular binding energies, these clusters have masses that are exact multiples of the unified atomic mass unit. This will allow ISOLTRAP to carry out absolute mass measurements as well as to investigate possible mass-dependent systematic errors. The results of tests of the production, transport, and trapping of such carbon clusters will be presented
Additional details
Identifiers
Publishing Information
- Journal Title
- Hyperfine Interactions
- Journal Volume
- 132
- Journal Issue
- 1-4
- Journal Page Range
- p. 507-511
- ISSN
- 0304-3843
- CODEN
- HYINDN
Conference
- Title
- 52. ASMS conference of mass spectrometry and allied topics
- Acronym
- APAC2000
- Dates
- 19-23 Sep 2000
- Place
- Cargese (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40085645
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; BINDING ENERGY; CARBON; CARBON IONS; EFFICIENCY; ERRORS; HEAT EXCHANGERS; ION BEAMS; ISOTOPES; MASS; MASS SPECTROMETERS; TRAPPING; TRAPS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELEMENTS; ENERGY; IONS; MEASURING INSTRUMENTS; NONMETALS; SPECTROMETERS
Optional Information
- Copyright
- Copyright (c) 2001 Kluwer Academic Publishers