Published January 2001 | Version v1
Journal article

Improvement of the Applicability, Efficiency, andPrecision of the Penning Trap Mass Spectrometer ISOLTRAP

  • 1. CERN (Switzerland)
  • 2. Michigan State University, NSCL (United States)
  • 3. GSI (Germany)
  • 4. CSNSM-IN2P3-CNRS (France)
  • 5. McGill University, Department of Physics (Canada)
  • 6. University of Jyvaeskylae, Department of Physics (Finland)

Description

With the Penning trap mass spectrometer ISOLTRAP, close to 200 nuclides have already been investigated and their masses determined with a typical relative precision of δm/m=10-7. Recently, ISOLTRAP's beam preparation system was replaced by an RFQ ion beam cooler and buncher. The principle and the characteristics of this new beam preparation system will be presented. It is planned to use ions of various carbon clusters C+n (n>1) as reference ions for mass measurements. Apart from negligible molecular binding energies, these clusters have masses that are exact multiples of the unified atomic mass unit. This will allow ISOLTRAP to carry out absolute mass measurements as well as to investigate possible mass-dependent systematic errors. The results of tests of the production, transport, and trapping of such carbon clusters will be presented

Additional details

Identifiers

Publishing Information

Journal Title
Hyperfine Interactions
Journal Volume
132
Journal Issue
1-4
Journal Page Range
p. 507-511
ISSN
0304-3843
CODEN
HYINDN

Conference

Title
52. ASMS conference of mass spectrometry and allied topics
Acronym
APAC2000
Dates
19-23 Sep 2000
Place
Cargese (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40085645
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; BINDING ENERGY; CARBON; CARBON IONS; EFFICIENCY; ERRORS; HEAT EXCHANGERS; ION BEAMS; ISOTOPES; MASS; MASS SPECTROMETERS; TRAPPING; TRAPS
Descriptors DEC
BEAMS; CHARGED PARTICLES; ELEMENTS; ENERGY; IONS; MEASURING INSTRUMENTS; NONMETALS; SPECTROMETERS

Optional Information

Copyright
Copyright (c) 2001 Kluwer Academic Publishers