Published 2014 | Version v1
Miscellaneous

Non-destructive tiles analysis in the central pavilion UFRRJ

Description

Full text: The UFRRJ has its origins in Decree 8319 of October 20, 1910, signed by Nilo Peçanha, President of the Republic, and Rodolfo Nogueira da Rocha Miranda, Minister of Agriculture, but only in 1948 had its campus moved to the margins of the former Rio - São Paulo highway, nowadays the (Brazilian Highway 465) BR-465. The 50 years old Central building (P1), undergoes reforms in its physical structure, including the roof. The replacement of damaged tiles began in 2013. The Central Building tiles of UFRRJ are the same kind as the tiles analyzed in this project, i.e., type Case and Canal being donated for this study by the Senior Management. Ceramics are inorganic materials used by man since prehistoric times. Resulting from heating at elevated temperatures, with or without pressure, a mixture of clays with oxides of metals, especially silicon oxides (silica, SiO2) and aluminum (alumina, Al2 O3). This paper presents an initial analysis of the tiles using the techniques of Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD). The results will allow one to perform an initial analysis of the conditions of the material after so long under the action of time. (author)

Availability note (English)

Available in abstract form only; full text entered in this record

Additional details

Publishing Information

Imprint Pagination
1 p.

Conference

Title
13. Brazilian SBPMat meeting
Dates
28 Sep - 2 Oct 2014
Place
Joao Pessoa, PB (Brazil)

INIS

Country of Publication
Brazil
Country of Input or Organization
Brazil
INIS RN
51032121
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
ALUMINIUM OXIDES; BUILDING MATERIALS; CERAMICS; CHEMICAL ANALYSIS; EDUCATIONAL FACILITIES; ROOFS; SCANNING ELECTRON MICROSCOPY; SILICON OXIDES; TIME DEPENDENCE; X-RAY DIFFRACTION
Descriptors DEC
ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MATERIALS; MECHANICAL STRUCTURES; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SILICON COMPOUNDS