Published 2002 | Version v1
Book Metadata-only

Using radiation sources to research the radiation effects of the electronic devices and the hardness technology

Creators

  • 1. Hebei Semiconductor Research Institute, Chinese Academy of Electronic (China)

Description

no abstract available

Part of:
The 13th pacific basin nuclear conference. Abstracts

Additional details

Publishing Information

Publisher
Atomic Energy Press
Imprint Place
Beijing (China)
ISBN
7-5022-2682-6
Imprint Title
The 13th pacific basin nuclear conference. Abstracts
Imprint Pagination
347 p.
Journal Page Range
p. 344

Conference

Title
13. pacific basin nuclear conference
Dates
21-25 Oct 2002
Place
Shenzhen (China)

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
35000032
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
ELECTRONIC EQUIPMENT; RADIATION EFFECTS; RADIATION HARDENING; RADIATION SOURCES; USES
Descriptors DEC
EQUIPMENT; HARDENING; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS

Optional Information