Published December 5, 2006
| Version v1
Journal article
Shape memory behavior of high temperature Ti-Ni-Pt thin films
- 1. Mechanical and Aerospace Engineering Department, University of California at Los Angeles, Los Angeles, California 90095-1597 (United States)
Description
Titanium-nickel-platinum (Ti54Ni26Pt20) thin films shape memory alloys are produced using direct current magnetron sputtering process. The films are deposited on a (100) silicon substrate with 500 nm of wet thermal oxide layer. As-deposited amorphous films are crystallized at 550 deg. C and 600 deg. C for 1 h. X-ray diffraction shows that the structure of the martensitic phase is orthorhombic (B19). Both films exhibit classic shape memory effect. The transformation temperatures for the films are above 300 deg. C, the film annealed at 600 deg. C has higher transformation temperatures which are attributed to the presence of large precipitates not found in the film annealed at 550 deg. C
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2006.07.153;
- PII
- S0040-6090(06)00976-X;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 515
- Journal Issue
- 4
- Journal Page Range
- p. 1938-1941
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38058166
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; DIRECT CURRENT; LAYERS; MAGNETRONS; NICKEL ALLOYS; ORTHORHOMBIC LATTICES; OXIDES; PLATINUM ALLOYS; SHAPE MEMORY EFFECT; SILICON; SPUTTERING; TEMPERATURE RANGE 0400-1000 K; THIN FILMS; TITANIUM ALLOYS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CURRENTS; DIFFRACTION; ELECTRIC CURRENTS; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; HEAT TREATMENTS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXYGEN COMPOUNDS; PLATINUM METAL ALLOYS; SCATTERING; SEMIMETALS; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.