Published April 1992 | Version v1
Journal article Metadata-only

A detection system for extended X-ray absorption fine structure spectrometer

Creators

  • 1. University of Science and Technology of China

Description

A detection system for the extended X-ray absorption fine structure (EXAFS) spectrometer is described in detail. The plateau characteristic, absorption curves and linearity of the system are measured using X-rays with energy about 10 keV. An oscillation phenomenon near K-shell absorption edge of nickel sample is observed by this detection system. The results are more accurate than those obtained by a detection system which consists of a proportional counter used as the front detector and a NaI(Tl) scintillation counter used as the rear detector

Additional details

Publishing Information

Journal Title
Nuclear Techniques
Journal Volume
15
Journal Issue
4
Journal Page Range
p. 214-221.
ISSN
0253-3219
CODEN
NUTEDL

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
24039118
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ATTENUATION; ELECTRONIC CIRCUITS; FINE STRUCTURE; K SHELL; MULTIWIRE PROPORTIONAL CHAMBER; NICKEL; PERFORMANCE; X-RAY DETECTION; X-RAY SPECTROMETERS
Descriptors DEC
DETECTION; ELECTRONIC STRUCTURE; ELEMENTS; MEASURING INSTRUMENTS; METALS; PROPORTIONAL COUNTERS; RADIATION DETECTION; RADIATION DETECTORS; SPECTROMETERS; TRANSITION ELEMENTS