Published February 15, 1974
| Version v1
Journal article
Delayed coincidence measurements using semiconductor detectors
Description
no abstract available
Additional details
Identifiers
Publishing Information
- Journal Title
- Nuclear Instruments and Methods
- Journal Volume
- 115
- Journal Issue
- 1
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 61-64
- ISSN
- 0029-554X
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 5134035
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCURACY; COINCIDENCE METHODS; ENERGY RESOLUTION; ENERGY SPECTRA; EXCITED STATES; HALF-LIFE; LI-DRIFTED GE DETECTORS; NEPTUNIUM 237; PROTACTINIUM 233; SURFACE BARRIER DETECTORS; TIMING PROPERTIES
- Descriptors DEC
- ALPHA DECAY RADIOISOTOPES; BETA DECAY RADIOISOTOPES; BETA-MINUS DECAY RADIOISOTOPES; COUNTING TECHNIQUES; DAYS LIVING RADIOISOTOPES; ENERGY LEVELS; GE SEMICONDUCTOR DETECTORS; HEAVY NUCLEI; ISOTOPES; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; NEPTUNIUM ISOTOPES; NUCLEI; ODD-EVEN NUCLEI; PROTACTINIUM ISOTOPES; RADIATION DETECTORS; RADIOISOTOPES; RESOLUTION; SEMICONDUCTOR DETECTORS; SPECTRA; YEARS LIVING RADIOISOTOPES
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent