Impact parameter dependent electron capture by decelerated U91+ ions at 20 MeV/u using crystal channeling conditions
Description
We present results of an experiment using decelerated U91+ ions, extracted from the GSI-ESR storage ring, and transmitted through a thin silicon crystal in channeling conditions. Charge state at emergence, secondary electron multiplicity and X-rays are measured simultaneously. These conditions allow to study the competition between mechanical electron capture (MEC) and radiative electron capture (REC) as a function of impact parameter. We observe that REC is the dominant charge exchange process for the best channeled ions, i.e. those travelling always far from the silicon target core electrons. For ions with high transverse energy, MEC into highly excited states is counterbalanced by enhanced ionization arising from a succession of close collisions along atomic rows
Additional details
Identifiers
- PII
- S0168583X0300541X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 205
- Journal Issue
- 1-4
- Journal Page Range
- p. 773-778
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 11. international conference on the physics of highly charged ions
- Dates
- 1-6 Sep 2002
- Place
- Caen (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34077556
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATION; CHANNELING; CHARGE EXCHANGE; CHARGE STATES; CRYSTALS; ELECTRON CAPTURE; ESR STORAGE RING; MEV RANGE 10-100; MULTICHARGED IONS; MULTIPLICITY; SILICON; THIN FILMS; TRANSVERSE ENERGY; URANIUM IONS
- Descriptors DEC
- CAPTURE; CHARGED PARTICLES; ELEMENTS; ENERGY; ENERGY RANGE; FILMS; IONS; KINETIC ENERGY; MEV RANGE; SEMIMETALS; STORAGE RINGS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.