Manipulating NiFe/AlOx interfacial chemistry for the spin-polarized electrons transport
Creators
- 1. Department of Materials Physics and Chemistry, University of Science and Technology Beijing, Beijing 100083 (China)
- 2. Department of Mechanical Engineering and Texas Center for Superconductivity (TcSUH), University of Houston, Houston, Texas 77204 (United States)
- 3. School of Materials and Chemical Engineering, Hainan University, Haikou 570228 (China)
Description
Through vacuum annealing, interfacial chemical composition of sputter-deposited AlOx/NiFe/AlOx can be controlled for electron transport manipulation. Chemical status change at the NiFe/AlOx interface was quantified by X-ray photoelectron spectroscopy and correlated to the structure and electron transport properties of the heterostructure. It is found that elemental Al existed in the insulting AlOx after annealing at intermediate temperature can improve the AlOx/NiFe interface and thus favor the electronic transport. Annealing at higher temperature will result in native AlOx formation and degrade transport properties due to the NiFe/AlOx interfaces deterioration caused by significant difference in thermal expansion coefficients of the two materials.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2013.05.151Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2013.05.151;
- PII
- S0169-4332(13)01091-X;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 283
- Journal Page Range
- p. 46-51
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46003592
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANNEALING; CHEMICAL COMPOSITION; ELECTRICAL PROPERTIES; FILMS; INTERFACES; IRON ALLOYS; MAGNETIC PROPERTIES; MAGNETRONS; NICKEL ALLOYS; SPIN ORIENTATION; SPUTTERING; TEMPERATURE DEPENDENCE; THERMAL EXPANSION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALLOYS; ELECTRON SPECTROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; EXPANSION; HEAT TREATMENTS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; ORIENTATION; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SPECTROSCOPY; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.