Published June 15, 2010 | Version v1
Journal article Metadata-only

Large strain deformation and cracking of nano-scale gold films on PDMS substrate

Creators

  • 1. Princeton Institute of Science and Technology of Materials (PRISM), 70 Prospect Street, Princeton, NJ 08544 (United States)
  • 2. Department of Mechanical and Aerospace Engineering, Princeton University, 1 Olden Street, Princeton, NJ 08544 (United States)
  • 3. Department of Mechanical Engineering, University of Arkansas, Little Rock, AR 72205 (United States)
  • 4. Department of Physics, Obafemi Awolowo University, Ile-Ife (Nigeria)
  • 5. Engineering Materials Development Institute, Akure (Nigeria)

Description

This paper presents the results of an experimental study of large strain tensile and cyclic damage in nano-scale gold (Au) thin films that were electron-beam deposited onto a 1mm thick polymeric substrate of poly-di-methyl-siloxane (PDMS). The effects of Au film thickness are examined for films with thicknesses of 50, 75 and 100 nm. Large strain deformation (up to 100%) is shown to give rise to grain boundary cracking that results in significant changes in film resistance under monotonic and cyclic loading. The implications of the results are discussed for development of flexible electronic structures.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.mseb.2010.02.023

Additional details

Identifiers

DOI
10.1016/j.mseb.2010.02.023;
PII
S0921-5107(10)00122-4;

Publishing Information

Journal Title
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
Journal Volume
170
Journal Issue
1-3
Journal Page Range
p. 32-40
ISSN
0921-5107
CODEN
MSBTEK

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43030253
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CRACKING; DAMAGE; DEFORMATION; ELECTRON BEAMS; ELECTRONIC STRUCTURE; GOLD; GRAIN BOUNDARIES; SILOXANES; STRAINS; SUBSTRATES; THICKNESS; THIN FILMS
Descriptors DEC
BEAMS; CHEMICAL REACTIONS; DECOMPOSITION; DIMENSIONS; ELEMENTS; FILMS; LEPTON BEAMS; METALS; MICROSTRUCTURE; ORGANIC COMPOUNDS; ORGANIC SILICON COMPOUNDS; PARTICLE BEAMS; PYROLYSIS; THERMOCHEMICAL PROCESSES; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.