Infrared imaging diagnostics for intense pulsed electron beam
Creators
- 1. International Research Center for Nuclei and Particles in the Cosmos, Beihang University, Beijing 100191 (China)
- 2. School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191 (China)
- 3. Institute of Heavy Ion Physics, Peking University, Beijing 100871 (China)
Description
Infrared imaging diagnostic method for two-dimensional calorimetric diagnostics has been developed for intense pulsed electron beam (IPEB). By using a 100-μm-thick tungsten film as the infrared heat sink for IPEB, the emitting uniformity of the electron source can be analyzed to evaluate the efficiency and stability of the diode system. Two-dimensional axisymmetric finite element method heat transfer simulation, combined with Monte Carlo calculation, was performed for error estimation and optimization of the method. The test of the method was finished with IPEB generated by explosive emission electron diode with pulse duration (FWHM) of 80 ns, electron energy up to 450 keV, and a total beam current of over 1 kA. The results showed that it is possible to measure the cross-sectional energy density distribution of IPEB with energy sensitivity of 0.1 J/cm2 and spatial resolution of 1 mm. The technical details, such as irradiation protection of bremsstrahlung γ photons and the functional extensibility of the method were discussed in this work
Additional details
Identifiers
- DOI
- 10.1063/1.4928069;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 86
- Journal Issue
- 8
- Journal Page Range
- p. 083305-083305.7
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47052712
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAM CURRENTS; BREMSSTRAHLUNG; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON SOURCES; FINITE ELEMENT METHOD; HEAT SINKS; INFRARED RADIATION; IRRADIATION; MONTE CARLO METHOD; PULSES; SENSITIVITY; SIMULATION; SPATIAL RESOLUTION; TUNGSTEN
- Descriptors DEC
- BEAMS; CALCULATION METHODS; CURRENTS; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; LEPTON BEAMS; MATHEMATICAL SOLUTIONS; METALS; NUMERICAL SOLUTION; PARTICLE BEAMS; PARTICLE SOURCES; RADIATION SOURCES; RADIATIONS; REFRACTORY METALS; RESOLUTION; SINKS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC