Published July 7, 1992 | Version v1
Patent Metadata-only

Gamma radiation compensated radon measurement system

Creators

Description

This patent describes a radon measurement system. It comprises means for defining a first sensing volume (SV1) and a second sensing volume (SV2); a first electret (E1) mounted to attract ions generated in the first sensing volume as a consequence of radon decay or gamma radiation therein; and a second electret (E2) mounted to attract ions generated in the second sensing volume as a consequence of radon decay or gamma radiation therein, the relative sensitivity of the second sensing volume to radon and gamma radiation being different from that of the first sensing volume

Availability note (English)

Patent and Trademark Office, Box 9, Washington, DC 20232 (United States).

Additional details

Publishing Information

Imprint Pagination
10 p.
IPC:
Int. Cl. G01T 1/00.
IPC
Int. Cl. G01T 1/00.
Patent number
US patent document 5,128,540/A/

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
24014549
Subject category
S54: ENVIRONMENTAL SCIENCES; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
AIR POLLUTION MONITORING; DAUGHTER PRODUCTS; ENVIRONMENTAL TRANSPORT; GAMMA RADIATION; RADIATION MONITORING; RADIATION MONITORS; RADON
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; ISOTOPES; MASS TRANSFER; MEASURING INSTRUMENTS; MONITORING; MONITORS; NONMETALS; RADIATIONS; RARE GASES