Published 1990
| Version v1
Book
Realistic evaluation of tester exposure based on Florida testing experience
Description
This paper reports on a radon decay product exposure model for Florida Certified Radon Measurement Technicians that has been formulated based on the guidance of 10CFR20. This model was used to estimate the exposure of 44 Florida measurement technicians from January through November of 1989. Comparing estimated testing and home exposure shows that 100% of the technicians observed received more exposure in the home than during testing activities. Exposure during normal office hours also exceed testing exposure in 86% of the technicians observed. Health and safety exposure data for radon measurement technicians does not follow the standard concepts of occupational radiation exposure normally accepted in 10CFR20
Additional details
Publishing Information
- Publisher
- Environmental Protection Agency.
- Imprint Place
- Cincinnati, OH (United States)
- Imprint Title
- Proceedings of the 1990 international symposium on radon and radon reduction technology
- Imprint Pagination
- vp.
- Journal Page Range
- p. 2.47-2.53.
Conference
- Title
- International symposium on radon and radon reduction technology.
- Dates
- 19-23 Feb 1990.
- Place
- Atlanta, GA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23053062
- Subject category
- S54: ENVIRONMENTAL SCIENCES; S54: ENVIRONMENTAL SCIENCES;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AIR POLLUTION; AIR POLLUTION CONTROL; AIR POLLUTION MONITORING; DAUGHTER PRODUCTS; ENVIRONMENT; ENVIRONMENTAL EXPOSURE PATHWAY; ENVIRONMENTAL IMPACTS; FLORIDA; HEALTH HAZARDS; OCCUPATIONAL EXPOSURE; PERSONNEL; RADIATION DOSES; RADON; SAFETY STANDARDS
- Descriptors DEC
- CONTROL; DEVELOPED COUNTRIES; ELEMENTS; HAZARDS; ISOTOPES; MONITORING; NONMETALS; NORTH AMERICA; POLLUTION; POLLUTION CONTROL; RARE GASES; STANDARDS; USA
Optional Information
- Secondary number(s)
- CONF-900224--.