Published July 15, 2012 | Version v1
Journal article

A comparative evaluation of surface morphology, cohesive and adhesive properties of one-step and two-step thermal deposited chromium thin films on glass substrates

  • 1. Institute of Material Science, Kaunas University of Technology, Savanorių 271, 3009 Kaunas (Lithuania)
  • 2. CSM Instruments SA, Rue de la Gare 4, 2034 Peseux (Switzerland)

Description

The surface morphology, cohesive and adhesive properties of one-step and two-step thermal deposited chromium thin films are investigated. Surface characterization is followed by the atomic force microscopy topography images, surface morphology parameters, height distribution histograms and bearing ratio curves with hybrid parameters. Cohesive and adhesive properties of the deposited chromium thin films were evaluated by scratch tests using the progressive loading followed with optical microscopy inspection. The two-step thermal deposition of chromium thin films followed by O2 plasma treatment after the first deposition gives better mechanical strengths as compared with conventional thermal deposition process. The changes involved in reflectance behavior of the films in UV/vis range are discussed.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2012.04.106

Additional details

Identifiers

DOI
10.1016/j.apsusc.2012.04.106;
PII
S0169-4332(12)00760-X;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
258
Journal Issue
19
Journal Page Range
p. 7633-7638
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44030873
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ADHESION; ADHESIVES; ATOMIC FORCE MICROSCOPY; CHROMIUM; DEPOSITION; DISTRIBUTION; FAILURES; GLASS; LAYERS; OPTICAL MICROSCOPY; PLASMA; SUBSTRATES; SURFACES; THIN FILMS; WEAR RESISTANCE
Descriptors DEC
ELEMENTS; FILMS; MECHANICAL PROPERTIES; METALS; MICROSCOPY; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.