A comparative evaluation of surface morphology, cohesive and adhesive properties of one-step and two-step thermal deposited chromium thin films on glass substrates
- 1. Institute of Material Science, Kaunas University of Technology, Savanorių 271, 3009 Kaunas (Lithuania)
- 2. CSM Instruments SA, Rue de la Gare 4, 2034 Peseux (Switzerland)
Description
The surface morphology, cohesive and adhesive properties of one-step and two-step thermal deposited chromium thin films are investigated. Surface characterization is followed by the atomic force microscopy topography images, surface morphology parameters, height distribution histograms and bearing ratio curves with hybrid parameters. Cohesive and adhesive properties of the deposited chromium thin films were evaluated by scratch tests using the progressive loading followed with optical microscopy inspection. The two-step thermal deposition of chromium thin films followed by O2 plasma treatment after the first deposition gives better mechanical strengths as compared with conventional thermal deposition process. The changes involved in reflectance behavior of the films in UV/vis range are discussed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2012.04.106Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2012.04.106;
- PII
- S0169-4332(12)00760-X;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 258
- Journal Issue
- 19
- Journal Page Range
- p. 7633-7638
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44030873
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ADHESION; ADHESIVES; ATOMIC FORCE MICROSCOPY; CHROMIUM; DEPOSITION; DISTRIBUTION; FAILURES; GLASS; LAYERS; OPTICAL MICROSCOPY; PLASMA; SUBSTRATES; SURFACES; THIN FILMS; WEAR RESISTANCE
- Descriptors DEC
- ELEMENTS; FILMS; MECHANICAL PROPERTIES; METALS; MICROSCOPY; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.