Published March 2010
| Version v1
Journal article
Focused ion beam/scanning electron microscopy tomography and conventional transmission electron microscopy assessment of Ni4Ti3 morphology in compression-aged Ni-rich Ni-Ti single crystals
Creators
- 1. EMAT, Department of Physics, University of Antwerp, B-2020 Antwerp (Belgium)
- 2. Institute for Materials, Ruhr University Bochum, D-44780 Bochum (Germany)
Description
The size, morphology and configuration of Ni4Ti3 precipitates in a single-crystal Ni-Ti alloy have been investigated by two-dimensional transmission electron microscopy-based image analysis and three-dimensional reconstruction from slice-and-view images obtained in a focused ion beam/scanning electron microscopy (FIB/SEM) dual-beam system. Average distances between the precipitates measured along the compression direction correlate well between both techniques, while particle shape and configuration data is best obtained from FIB/SEM. Precipitates form pockets of B2 of 0.54 μm in the compression direction and 1 μm perpendicular to the compression direction.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2009.11.040Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2009.11.040;
- PII
- S1359-6462(09)00752-0;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 62
- Journal Issue
- 6
- Journal Page Range
- p. 399-402
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45024260
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COMPRESSION; IMAGE PROCESSING; INTERMETALLIC COMPOUNDS; ION BEAMS; MONOCRYSTALS; MORPHOLOGY; NICKEL; PRECIPITATION; SCANNING ELECTRON MICROSCOPY; SHAPE MEMORY EFFECT; THREE-DIMENSIONAL CALCULATIONS; TITANIUM; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; TWO-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- ALLOYS; BEAMS; CRYSTALS; DIAGNOSTIC TECHNIQUES; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; PROCESSING; SEPARATION PROCESSES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.