Visualization of refrigerant behaviors in a variable conductance heat pipe by neutron radiography
Creators
- 1. Kobe University, Graduate School of Engineering, Kobe, Hyogo (Japan)
- 2. Mitsubishi Electric Corp., Advanced Technology R and D Center, Amagasaki, Hyogo (Japan)
Description
Variable Conductance Heat Pipes (VCHP) are used as a cooling device which can passively keep the evaporating temperature by enclosing non-condensable gas (NCG) with refrigerant. The VCHP has often a bend section between evaporating and condensing area, since the condensation section should be placed vertically above the evaporation section. It is known that the bend may disturb a liquid flow to the evaporation section. The effect of the VCHP orientation, filling ratio of the refrigerant, amount of the charged NCG have been examined. A thin plate was inserted to more the effects of the bend. In this study, the refrigerant behaviors in the VCHP with the bend were diagnosed based on flow visualization by neutron radiography. It was observed that liquid plugs formed at the bend and suppressed the condensed liquid supply to the evaporating section without the thin plate. It was also shown that the thin plate inserted in the bend was effective to avoid the liquid plug formation. (author)
Availability note (English)
Available from http://dx.doi.org/10.11368/tse.21.59Additional details
Identifiers
- DOI
- 10.11368/tse.21.59;
Publishing Information
- Journal Title
- Thermal Science and Engineering (Online)
- Journal Volume
- 21
- Journal Issue
- 2
- Journal Page Range
- p. 59-66
- ISSN
- 1882-2592
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 48101646
- Subject category
- S42: ENGINEERING;
- Descriptors DEI
- CHARGE-COUPLED DEVICES; DIFFUSION; DRYOUT; DUCTS; EVAPORATION; FILM CONDENSATION; FLOW VISUALIZATION; HEAT PIPES; HEAT TRANSFER; HEATERS; NEUTRON RADIOGRAPHY; NEUTRON SOURCES; REFRIGERANTS; THERMOCOUPLES
- Descriptors DEC
- ENERGY TRANSFER; FLUIDS; INDUSTRIAL RADIOGRAPHY; MATERIALS TESTING; MEASURING INSTRUMENTS; NONDESTRUCTIVE TESTING; PARTICLE SOURCES; PHASE TRANSFORMATIONS; RADIATION SOURCES; SEMICONDUCTOR DEVICES; TESTING; VAPOR CONDENSATION; WORKING FLUIDS
Optional Information
- Notes
- 3 refs., 13 figs., 2 tabs.