A sequential logic circuit for coincidences randomly distributed in 'time' and 'duration', with selection and total sampling
Creators
- 1. Commissariat a l'energie atomique et aux energies alternatives - CEA, Centre d'Etudes Nucleaires de Saclay, Services d'Electronique de Saclay, Service d'Electronique Industrielle (France)
Description
The principles of binary analysis applied to the investigation of sequential circuits were used to design a two way coincidence circuit whose input may be, random or periodic variables of constant or variable duration. The output signal strictly reproduces the characteristics of the input signal triggering the coincidence. A coincidence between input signals does not produce any output signal if one of the signals has already triggered the output signal. The characteristics of the output signal in relation to those of the input signal are: minimum time jitter, excellent duration reproducibility and maximum efficiency. Some rules are given for achieving these results. The symmetry, transitivity and non-transitivity characteristics of the edges on the primitive graph are analyzed and lead to some rules for positioning the states on a secondary graph. It is from this graph that the equations of the circuits can be calculated. The development of the circuit and its dynamic testing are discussed. For this testing, the functioning of the circuit is simulated by feeding into the input randomly generated signals
Files
49015564.pdf
Files
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Additional details
Additional titles
- Original title (French)
- Etude d'un circuit logique sequentiel de coincidences aleatoires en 'temps' et en 'duree', a selection et prelevement total
Publishing Information
- Imprint Pagination
- 102 p.
- Report number
- CEA-R--4209
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 49015564
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COINCIDENCE CIRCUITS; COUNTING CIRCUITS; DIAGRAMS; EFFICIENCY; FEEDBACK; GATING CIRCUITS; LOGIC CIRCUITS; RELIABILITY; SEQUENTIAL CIRCUITS; TESTING; TIME DELAY; TIME DEPENDENCE; VERIFICATION
- Descriptors DEC
- ELECTRONIC CIRCUITS; INFORMATION