Strain-delocalizing effect of a metal substrate on nanocrystalline Ni film
- 1. Department of Mechanical Engineering, Nanjing Tech University, Nanjing, Jiangsu Province 210009 (China)
- 2. Department of Mechanical Engineering, Wuhan Institute of Technology, Wuhan, Hubei Province 430070 (China)
- 3. Department of Mechanical and Electronic Engineering, Suzhou Institute of Industrial Technology, Suzhou, Jiangsu 215104 (China)
Description
Uniaxial tensile test and scanning electron microscopy (SEM) are introduced to study the tensile properties of electrodeposited nanocrystalline nickel/coarse-grained copper (N/C) composite in this paper. Compared to the stress strain response of pure nanocrystalline (NC) nickel (Ni), the tensile ductility of N/C composite is enhanced significantly. Based on the experimental results, a multi-phase composite model is proposed to investigate the micromechanical behaviors of the NC Ni film and N/C composite plate. The constitutive models are implemented into ABAQUS/Explicit in the form of VUMAT subroutine. A series of numerical simulations are carried out and the predications were in good agreement with experimental results. It can be concluded that the coarse-grained (CG) substrate work well in suppressing the strain localization in the NC Ni film
Availability note (English)
Available from http://dx.doi.org/10.1016/j.msea.2015.06.010Additional details
Identifiers
- DOI
- 10.1016/j.msea.2015.06.010;
- PII
- S0921-5093(15)30064-2;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 640
- Journal Page Range
- p. 408-418
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47049275
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- A CODES; COMPARATIVE EVALUATIONS; COMPOSITE MODELS; COMPUTERIZED SIMULATION; COPPER; CRYSTALS; DUCTILITY; ELECTRODEPOSITION; FILMS; FINITE ELEMENT METHOD; NANOSTRUCTURES; NICKEL; PLATES; SCANNING ELECTRON MICROSCOPY; SHEAR; STRAINS; STRESSES; SUBSTRATES
- Descriptors DEC
- CALCULATION METHODS; COMPUTER CODES; DEPOSITION; ELECTROLYSIS; ELECTRON MICROSCOPY; ELEMENTS; EVALUATION; LYSIS; MATHEMATICAL MODELS; MATHEMATICAL SOLUTIONS; MECHANICAL PROPERTIES; METALS; MICROSCOPY; NUMERICAL SOLUTION; PARTICLE MODELS; SIMULATION; SURFACE COATING; TENSILE PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.