Published May 2003
| Version v1
Journal article
Construction of an ultra low temperature STM with a bottom loading mechanism
Description
We have constructed and tested an ultra-low temperature scanning tunneling microscope that works with an atomic resolution at ultra low temperatures (T≥126 mK) in magnetic fields (B≤6 T) in ultra high vacuum (UHV). Clean sample surfaces can be prepared by several different methods and characterized by low energy electron diffraction in situ of UHV. A unique bottom loading mechanism enables us to cool back to the base temperature within 3 h after changing the sample and scanning tunneling microscopy tips
Additional details
Identifiers
- DOI
- 10.1016/S0921-4526(02)02446-8;
- arXiv
- arXiv:math/0411079v3;
- PII
- S0921452602024468;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 329-333
- Journal Issue
- 1-2
- Journal Page Range
- p. 1653-1655
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 23. international conference on low temperature physics
- Dates
- 20-27 Aug 2002
- Place
- Hiroshima (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36110108
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRON DIFFRACTION; MAGNETIC FIELDS; RESOLUTION; SCANNING TUNNELING MICROSCOPY; SURFACES; TEMPERATURE RANGE 0000-0013 K
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; MICROSCOPY; SCATTERING; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.