Published May 2003 | Version v1
Journal article

Construction of an ultra low temperature STM with a bottom loading mechanism

Description

We have constructed and tested an ultra-low temperature scanning tunneling microscope that works with an atomic resolution at ultra low temperatures (T≥126 mK) in magnetic fields (B≤6 T) in ultra high vacuum (UHV). Clean sample surfaces can be prepared by several different methods and characterized by low energy electron diffraction in situ of UHV. A unique bottom loading mechanism enables us to cool back to the base temperature within 3 h after changing the sample and scanning tunneling microscopy tips

Additional details

Identifiers

DOI
10.1016/S0921-4526(02)02446-8;
arXiv
arXiv:math/0411079v3;
PII
S0921452602024468;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
329-333
Journal Issue
1-2
Journal Page Range
p. 1653-1655
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
23. international conference on low temperature physics
Dates
20-27 Aug 2002
Place
Hiroshima (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36110108
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON DIFFRACTION; MAGNETIC FIELDS; RESOLUTION; SCANNING TUNNELING MICROSCOPY; SURFACES; TEMPERATURE RANGE 0000-0013 K
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; MICROSCOPY; SCATTERING; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.