Published December 1996 | Version v1
Miscellaneous

Self-supporting film method of silicon single crystal by ion implantation and it's application

  • 1. National Industrial Research Inst. of Nagoya (Japan)

Description

A few μm of thickness of self-supporting film of silicon single crystal was produced by the ion implantation and the selective etching. This materials are distinguished by a uniform film thickness, good controllability, crystallization and the mechanical strength. For applying it to device, the detailed process has to be established, because there are some improved problems such as pinhole and morphology on the surface. This materials are very useful to the basic experiment of the base for epitaxial growth under irradiation of ion beams and the ion beam analysis in the atmosphere. (S.Y.)

Part of:
Proceedings of 9th workshop on tandem accelerators and peripheral techniques

Additional details

Additional titles

Original title (Japanese)
Dai-9-kai tandemu kasokuki oyobi sono shuhengijutsu no kenkyukai hokokushu.

Publishing Information

Imprint Title
Proceedings of 9th workshop on tandem accelerators and peripheral techniques
Imprint Pagination
119 p.
Journal Page Range
p. 76-79.
Report number
INIS-JP--078

Conference

Title
9. workshop on tandem accelerators and peripheral techniques.
Dates
4-5 Jul 1996.
Place
Tokai, Ibaraki (Japan).

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
29018523
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ETCHING; ION IMPLANTATION; MONOCRYSTALS; SILICON; SURFACE PROPERTIES; THICKNESS; THIN FILMS
Descriptors DEC
CRYSTALS; DIMENSIONS; ELEMENTS; FILMS; SEMIMETALS

Optional Information

Notes
Imprint:Dai-9-kai tandemu kasokuki oyobi sono shuhengijutsu no kenkyukai hokokushu.