Progress on β-decay induced X-ray spectroscopy for tritium analysis

This paper presents the status and recent progress on β-decay induced X-ray spectroscopy (BIXS) for tritium measurements. The development history of BIXS method and its applications on tritium analysis are introduced, and at the same time the characteristics of three kinds of BIXS methods, i.e. calibration curve method, analytical method and Monte Carlo simulations combined with Tikhonov regularization method are also introduced. The recent studies on the BIXS method performed in our group, including the incorporation of Monte Carlo simulation and regularization method, effects of internal bremsstrahlung of tritium β-decay, sample surface roughness, tritium content and geometrical parameter's uncertainty of experimental setup in BIXS method, and the application are mainly presented. Finally, the general comments on the further improvements of the BIXS method are given. (authors)