Published 2004 | Version v1
Miscellaneous

Structural characterization of amorphous compound semiconductors with EXAFS

  • 1. Laboratorio Nacional de Luz Sincrotron (LNLS), Campinas, SP (Brazil)

Description

no abstract available

Part of:
14. Annual meeting of the LNLS users - Abstracts

Additional details

Additional titles

Original title (English)
14. Reuniao anual de usuarios do LNLS - Resumos

Publishing Information

Imprint Title
14. Annual meeting of the LNLS users - Abstracts
Imprint Pagination
285 p.
Journal Page Range
p. 91

Conference

Title
14. Annual meeting of the LNLS users
Original Conference Title
14. Reuniao anual de usuarios do LNLS
Dates
9-11 Feb 2004
Place
Campinas, SP (Brazil)

Optional Information

Notes
Imprint:14. Reuniao anual de usuarios do LNLS - Resumos