Microwave properties of large ion implanted niobium microbridges
- 1. Inst. Fizyki PAN, 02668 Warszawa (Poland)
- 2. Inst. di Cibernetica del CNR, 80072 Arco Felice (Italy)
- 3. Dept. di Fisica, Univ. di Trenton, 38050 Povo (Italy)
Description
Ion implantation has proved to be a reliable technique for fabricating thin film Josephson weak links suitable for practical applications. Moreover, ion implanted junction composed of a short and wide strip of a highly damaged superconductor linking two strongly superconducting banks models the intrinsic high-Tc intergranualar junctions much better then the tunnel junction model frequently recalled for that purpose. Therefore, the detailed understanding of the mechanism governing the behavior of an implanted microbridge is of an extreme and current importance. The most powerful tool for testing the physics and Josephson properties of a weak link is the microwave technique. In this paper the authors report on the detailed investigation on the behavior of microwave induced steps in the nitrogen implanted niobium microbridges possessing effective link dimensions large respect to the coherence length ξ
Additional details
Publishing Information
- Publisher
- Nova Science Publishers, Inc.
- Imprint Place
- Commack, NY (United States)
- ISBN
- 0-941743-78-0
- Imprint Title
- Weak superconductivity
- Imprint Pagination
- 302 p.
- Journal Page Range
- p. 213-218.
Conference
- Title
- 5. Czechoslovak symposium on weak superconductivity.
- Dates
- 29 May - 2 Jun 1989.
- Place
- Smolenice (Czechoslovakia).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24025676
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM-PLASMA SYSTEMS; COHERENCE LENGTH; FABRICATION; HIGH-TC SUPERCONDUCTORS; INTERACTIONS; ION IMPLANTATION; JOSEPHSON JUNCTIONS; MICROWAVE RADIATION; NIOBIUM; NITROGEN IONS; PERFORMANCE TESTING; SUPERCONDUCTING FILMS; TUNNEL EFFECT; WEAK-COUPLING MODEL
- Descriptors DEC
- CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; IONS; MATHEMATICAL MODELS; METALS; NUCLEAR MODELS; RADIATIONS; SEMICONDUCTOR JUNCTIONS; SUPERCONDUCTORS; TESTING; TRANSITION ELEMENTS
Optional Information
- Secondary number(s)
- CONF-890557--.