Synchrotron topographic studies of the effects of elastic stress on magnetic domain configurations in Fe 3.5 wt%. Si single crystals

White beam synchrotron X-ray topography has been used to conduct in situ studies of the influence of applied elastic tensile stress on magnetic domain configurations in Fe 3.5 wt% Si single crystals. Specimens of [011] tensile axis, and either (100) or (0anti 11) surface orientation were utilized. Tensile stress was applied using a specially designed miniature tensile stage. In specimens of (0anti 11), surface the characteristic Dijkstra and Martius type I structure is included upon application of stress, eventually to be replaced by the type II structure. The transition is understandable in terms of stress-induced anisotropy. On the other hand, in specimens of (100) surface, the initial structure, which essentially consists of 900 was perpendicular to the tensile axis, changes to one which mainly consists of (010) and (001) 1800 walls. Both structures have approximately equal volumes magnetized along [001] and [010]. This suggests that the transition is not driven by induced anisotropy. Alternative explanatiions are discussed. Changes in domain configurations around inclusions are also discussed. (orig.)